Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.
- ISBN10 128124287X
- ISBN13 9781281242877
- Publish Date 1 January 2008
- Publish Status Active
- Out of Print 25 March 2015
- Publish Country US
- Imprint Springer Us
- Pages 330
- Language English