Automated Visual Inspection and Machine Vision (Proceedings of SPIE)

by Jurgen Beyerer and Fernando Puente Leon

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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
  • ISBN13 9781628416909
  • Publish Date 30 September 2015
  • Publish Status Active
  • Publish Country US
  • Imprint SPIE Press
  • Format Paperback
  • Pages 277
  • Language English