Low Temperature Silicon Epitaxy: Defects and Electronic Properties (Berichte Aus Der Halbleitertechnik)

by Thomas Wagner

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  • ISBN10 3832218076
  • ISBN13 9783832218072
  • Publish Date 21 August 2003
  • Publish Status Active
  • Publish Country DE
  • Imprint Shaker Verlag GmbH, Germany
  • Format Paperback
  • Pages 142
  • Language English