Robust Design of DRAM Core Circuits: Yield Estimation and Analysis by a Statistical Design Approach (Ausgewahlte Probleme Der Elektronik Und Mikromechatronik S., v. 37)

by Yan Li

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  • ISBN10 3832298452
  • ISBN13 9783832298456
  • Publish Date 28 February 2011
  • Publish Status Active
  • Publish Country DE
  • Imprint Shaker Verlag GmbH, Germany
  • Format Paperback
  • Pages 139
  • Language English