Andrew Thye Shen Wee

3 books • 1 series

Mar 8, 2022
Cover of Introduction to Spectroscopic Ellipsometry of Thin Film Materials – Instrumentation, Data Analysis and Applications

Introduction to Spectroscopic Ellipsometry of Thin Film Materials – Instrumentation, Data Analysis and Applications

Jun 23, 2009
Cover of Selected Topics in Nanoscience and Nanotechnology

Selected Topics in Nanoscience and Nanotechnology

Mar 31, 2001
Cover of Advanced Microelectronic Processing Techniques

Advanced Microelectronic Processing Techniques (Proceedings of SPIE, v. 4227)