A Guide to Noise in Microwave Circuits: Devices, Circuits and Measurement

by Peter Heymann and Matthias Rudolph

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A GUIDE TO NOISE IN MICROWAVE CIRCUITS

A fulsome exploration of critical considerations in microwave circuit noise

In A Guide to Noise in Microwave Circuits: Devices, Circuits, and Measurement, a team of distinguished researchers deliver a comprehensive introduction to noise in microwave circuits, with a strong focus on noise characterization of devices and circuits. The book describes fluctuations beginning with their physical origin and touches on the general description of noise in linear and non-linear circuits.

Several chapters are devoted to the description of noise measurement techniques and the interpretation of measured data. A full chapter is dedicated to noise sources as well, including thermal, shot, plasma, and current.

A Guide to Noise in Microwave Circuits offers examples of measurement problems-like low noise block (LNB) of satellite television - and explores equipment and measurement methods, like the Y, cold source, and 7-state method. This book also includes:

  • A thorough introduction to foundational terms in microwave circuit noise, including average values, amplitude distribution, autocorrelation, cross-correlation, and noise spectra
  • Comprehensive explorations of common noise sources, including thermal noise, the Nyquist formula and thermal radiation, shot noise, plasma noise, and more
  • Practical discussions of noise and linear networks, including narrowband noise
  • In-depth examinations of calculation methods for noise quantities, including noise voltages, currents, and spectra, the noise correlation matrix, and the noise of simple passive networks

Perfect for graduate students specializing in microwave and wireless electronics, A Guide to Noise in Microwave Circuits: Devices, Circuits, and Measurement will also earn a place in the libraries of professional engineers working in microwave or wireless circuits and system design.

  • ISBN13 9781119859383
  • Publish Date 2 December 2021 (first published 26 November 2021)
  • Publish Status Active
  • Publish Country US
  • Publisher John Wiley & Sons Inc
  • Imprint Standards Information Network