The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
- ISBN10 0769521347
- ISBN13 9780769521343
- Publish Date 31 August 2004
- Publish Status Active
- Publish Country US
- Imprint IEEE Computer Society Press,U.S.
- Format Paperback
- Pages 550
- Language English