VLSI Test Symposium (VTS 2003), 21st IEEE

by IEEE

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The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
  • ISBN10 0769519245
  • ISBN13 9780769519241
  • Publish Date 30 June 2003
  • Publish Status Active
  • Publish Country US
  • Imprint I.E.E.E.Press
  • Format Paperback
  • Pages 492
  • Language English