Thermal Testing of Integrated Circuits

by J. Altet and Antonio Rubio

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Book cover for Thermal Testing of Integrated Circuits

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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

  • ISBN13 9781402070761
  • Publish Date 30 June 2002
  • Publish Status Active
  • Publish Country US
  • Imprint Springer-Verlag New York Inc.
  • Edition 2002 ed.
  • Format Hardcover
  • Pages 204
  • Language English