An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science (Iop Concise Physics)

by Sarah Fearn

0 ratings • 0 reviews • 0 shelved
Book cover for An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science
Shelve It

Bookhype may earn a small commission from qualifying purchases. Full disclosure.

  • ISBN10 1681740885
  • ISBN13 9781681740881
  • Publish Date 16 October 2015
  • Publish Status Active
  • Publish Country US
  • Imprint Iop Concise Physics
  • Format eBook
  • Pages 66
  • Language English