Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
- ISBN13 9789400797987
- Publish Date 15 October 2014 (first published 21 September 2012)
- Publish Status Active
- Publish Country NL
- Imprint Springer
- Edition 2013 ed.
- Format Paperback
- Pages 124
- Language English