Scanning Spreading Resistance Microscopy and its Application to Passive and Active Semiconductor Device Characterization (Research at Namlab, #5)

by Stefan Doring

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  • ISBN13 9783832544508
  • Publish Date 31 March 2017
  • Publish Status Active
  • Publish Country DE
  • Imprint Logos Verlag Berlin GmbH
  • Format Paperback
  • Pages 178
  • Language English