Fundamentals of Nanoscale Film Analysis

by Terry L. Alford, L.C. Feldman, and James W. Mayer

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Book cover for Fundamentals of  Nanoscale Film Analysis

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From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.

  • ISBN13 9781441939807
  • Publish Date 29 October 2010 (first published 1 January 2007)
  • Publish Status Active
  • Publish Country US
  • Imprint Springer-Verlag New York Inc.
  • Edition Softcover reprint of hardcover 1st ed. 2007
  • Format Paperback
  • Pages 336
  • Language English