This workshop is a forum for discussion of issues in the generation and utilization of statistically significant measurements to characterize and VLSI validate processes, designs and equipment operations. Topics include: metadata; object-orientated techniques; and multidimensional data.
- ISBN10 0780337379
- ISBN13 9780780337374
- Publish Date 31 October 1997
- Publish Status Out of Print
- Out of Print 13 February 2009
- Publish Country US
- Imprint I.E.E.E.Press
- Format Paperback
- Pages 100
- Language English