Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.

by Manoj Sachdev and Jos Pineda De Gyvez

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  • ISBN10 6610938210
  • ISBN13 9786610938216
  • Publish Date 1 January 2007
  • Publish Status Active
  • Out of Print 9 February 2012
  • Publish Country US
  • Imprint Springer
  • Format eBook
  • Pages 343
  • Language English