Manoj Sachdev

6 books • 4 series

Jan 1, 2008
Cover of CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, #40)

Jan 1, 2008
Cover of Esd Protection Device and Circuit Design for Advanced CMOS Technologies

Esd Protection Device and Circuit Design for Advanced CMOS Technologies

Jan 1, 2007
Cover of Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, #34)

Jan 1, 2007
Cover of Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, Volume 34.

Jan 1, 2006
Cover of Thermal and Power Management of Integrated Circuits

Thermal and Power Management of Integrated Circuits (Lecture Notes in Artificial Intelligence, #323) (Integrated Circuits and Systems) (Series on Integrated Circuits and Systems)

Dec 31, 1997
Cover of Defect Oriented Testing for CMOS Analog and Digital Circuits

Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing, v. 10)