Volume One of this set is an updated manual covering the theory and practice of X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) techniques for surface analysis. The text takes into account improvements in equipment, experimental procedures and data interpretation over the last few years. Volume Two reflects the rapid evolution of surface analysis techniques involving ion and neural spectroscopies. Sputtering techniques are comprehensively discussed in chapters covering instrumentation, theory, quantification, dynamic and static SIMS and various applications.
- ISBN10 0471971316
- ISBN13 9780471971313
- Publish Date 25 July 1996 (first published 26 September 1990)
- Publish Status Out of Print
- Out of Print 10 September 1998
- Publish Country GB
- Publisher John Wiley and Sons Ltd
- Imprint John Wiley & Sons Ltd
- Edition 2nd Revised edition
- Format Paperback
- Pages 1450
- Language English