Optical Metrology S.
1 primary work
Book 3
These proceedings document the contributions to the 3rd International Workshop on Automatic Processing of Fringe Patterns (Bremen/Germany, September 1997). Engineers, scientists, and industrial experts present and discuss the current status and the impact of computer-aided fringe pattern analysis in structured light techniques, holographic interferometry, classic interferometry, speckle metrology, moir? and grid techniques. Applications cover stress analysis, nondestructive testing, shape recognition, fault detection and quality control. Each of the five sections contains an invited paper providing a detailed review of the latest achievements and developments in the rapidly advancing field.