Springer Series in Surface Sciences
1 primary work
Book 38
Progress in Transmission Electron Microscopy 1
Published 18 October 2001
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications.