The Springer International Series in Engineering and Computer Science
2 primary works
Book 312
Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
by Gordon W. Roberts and Albert K. Lu
Published 30 April 1995
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
Book 534
Design and Analysis of Integrator-Based Log-Domain Filter Circuits
by Gordon W. Roberts and Vincent W. Leung
Published 1 January 1999
This title deals with the design and analysis of log-domain filter circuits. It describes synthesis methods for developing bipolar or BiCMOS filter circuits with cut-off frequencies ranging from the low kilohertz range to several hundred megahertz. Numerous examples provide measured experimental data from IC prototypes.