Failure Analysis: High Technology Devices (De Gruyter STEM)

by Daniel J. D. Sullivan and Eric J. Carleton

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The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
  • ISBN10 1501524798
  • ISBN13 9781501524790
  • Publish Date 18 November 2022
  • Publish Status Forthcoming
  • Publish Country US
  • Imprint De Gruyter