Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories

by Abhishek Chakraborty and Pinaki Mazumder

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Book cover for Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories

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This book deals with primarily with reliable and faul-tolerant circuit design and evaluation techniques for RAMS. It examines both the manufacturing faul-tolerance (e.g. self-repair at the time of manufacturing) and online and field-related fault-tolerance (e.g. error-correction). It talks a lot about important techniques and requirements, and explains what needs to be done and why for each of the techniques.

  • ISBN10 0130084654
  • ISBN13 9780130084651
  • Publish Date 24 June 2002
  • Publish Status Out of Print
  • Out of Print 12 June 2010
  • Publish Country US
  • Imprint Prentice Hall
  • Format Hardcover
  • Pages 448
  • Language English