High Frequency Techniques for Advanced Mos Device Characterization.

by Yun Wang

0 ratings • 0 reviews • 0 shelved
Book cover for High Frequency Techniques for Advanced Mos Device Characterization.
Shelve It

Bookhype may earn a small commission from qualifying purchases. Full disclosure.

  • ISBN10 1243603186
  • ISBN13 9781243603180
  • Publish Date 1 September 2011
  • Publish Status Unknown
  • Out of Print 29 December 2014
  • Publish Country US
  • Imprint Proquest, Umi Dissertation Publishing
  • Format Paperback (US Trade)
  • Pages 256
  • Language English