Reliability and Degradation of III-V Optical Devices (Solid State Technology & Devices Library)

by Osamu Ueda

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Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.
  • ISBN10 0890066523
  • ISBN13 9780890066522
  • Publish Date 30 September 1996
  • Publish Status Active
  • Publish Country US
  • Imprint Artech House Publishers
  • Format Hardcover
  • Pages 372
  • Language English