This text deals with physical mechanisms that reduce the reliability or performance of integrated circuits and microelectronics. It covers such topics as: advanced semiconductor devices; failure and yield enhancement analysis; device dielectrics; channel hot carriers; and ESD and latchup."
- ISBN10 0780344006
- ISBN13 9780780344006
- Publish Date 31 May 1998
- Publish Status Active
- Publish Country US
- Imprint I.E.E.E.Press
- Format Paperback
- Pages 400
- Language English