This text covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliabilty; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.
- ISBN10 0780377222
- ISBN13 9780780377226
- Publish Date 30 September 2003
- Publish Status Out of Print
- Out of Print 3 October 2008
- Publish Country US
- Imprint I.E.E.E.Press
- Format Paperback
- Pages 300
- Language English