Study of Gate Oxide Breakdown and Hot Electron Effect on CMOS Circuit Performances

by Jun Ma

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  • ISBN10 1243729732
  • ISBN13 9781243729736
  • Publish Date 1 September 2011
  • Publish Status Unknown
  • Publish Country US
  • Imprint Proquest, Umi Dissertation Publishing
  • Format Paperback (US Trade)
  • Pages 120
  • Language English