Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX (Proceedings of SPIE)

Selim M. Shahriar (Editor)

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Book cover for Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX

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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
  • ISBN13 9781628419986
  • Publish Date 30 September 2016
  • Publish Status Active
  • Publish Country US
  • Imprint SPIE Press
  • Format Paperback
  • Pages 202
  • Language English