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Electrical Characterisation of Ferroelectric Field Effect Transistors Based on Ferroelectric Hfo_2thin Films
(Research at Namlab, #4)
by
Ekaterina Yurchuk
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Electrical Characterisation of Ferroelectric Field Effect Transistors Based on Ferroelectric Hfo_2thin Films
(Research at Namlab, #4)
by
Ekaterina Yurchuk
0 ratings • 0 reviews • 0 shelved
This Edition
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ISBN13
9783832540036
Publish Date
30 June 2015
Publish Status
Active
Publish Country
DE
Imprint
Logos Verlag Berlin GmbH
Format
Paperback
Pages
179
Language
English