Developments in the Use of Failure Rate Data and Reliability Prediction Methods for Hardware

by David John Smith

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  • ISBN10 0951656260
  • ISBN13 9780951656266
  • Publish Date 1 January 2000
  • Publish Status Active
  • Publish Country GB
  • Imprint Technis
  • Format Paperback
  • Pages 180
  • Language English