A Study of Nanometer Semiconductor Scaling Effects on Microelectronics Reliability.

by Mark White

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  • ISBN10 124402676X
  • ISBN13 9781244026766
  • Publish Date 11 September 2011
  • Publish Status Unknown
  • Publish Country US
  • Imprint Proquest, Umi Dissertation Publishing
  • Format Paperback (US Trade)
  • Language English