This is the first comprehensive and unified treatment to describe the physical principles behind experimental techniques used for measuring the electrical properties of semiconductors. The principles involved are illustrated by reference to selected examples drawn from the world of semiconductor materials. By concentrating on the physical principles of each technique and enumerating its inherent limitations, the authors have produced a text which should be helpful in solving a variety of problems in semiconductor characterization and one which will not be overtaken quickly by development in the materials themselves.
- ISBN10 0125286279
- ISBN13 9780125286275
- Publish Date 29 October 1997
- Publish Status Out of Print
- Out of Print 21 November 2009
- Publish Country US
- Publisher Elsevier Science Publishing Co Inc
- Imprint Academic Press Inc
- Format Hardcover
- Pages 768
- Language English