Measurement Variability of Vertical Scanning Interferometry Tool Used for Orbiter Window Defect Assessment

by National Aeronautics and Space Adm Nasa

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  • ISBN10 1794279636
  • ISBN13 9781794279636
  • Publish Date 18 January 2019
  • Publish Status Temporarily Withdrawn
  • Imprint Independently Published
  • Format Paperback (US Trade)
  • Pages 32
  • Language English