Logic-Level Testing and Defect Characterization: Chapter 5 from Design & Test of Digital Circuits by Quantum-Dot Cellular Automata

by M Momenzadeh, J. Huang, and F Lombardi

0 ratings • 0 reviews • 0 shelved
Book cover for Logic-Level Testing and Defect Characterization
Shelve It

Bookhype may earn a small commission from qualifying purchases. Full disclosure.

  • ISBN10 1607831864
  • ISBN13 9781607831860
  • Publish Date 31 October 2007
  • Publish Status Active
  • Publish Country US
  • Imprint Artech House Publishers
  • Format eBook
  • Language English