Biometric Quality: The Last 1%: Biometric Quality Assessment for Error Suppression

by Patrick Grother, National Institute of Standards and Tech, and Elham Tabassi

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  • ISBN10 1495984508
  • ISBN13 9781495984501
  • Publish Date 30 November 2008
  • Publish Status Active
  • Imprint Createspace Independent Publishing Platform
  • Format Paperback (US Trade)
  • Pages 68
  • Language English