Advanced Laser Diode Reliability

by Massimo Vanzi, Laurent Bechou, Mitsuo Fukuda, and Giovanna Mura

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Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
  • ISBN13 9781785481543
  • Publish Date 13 July 2021
  • Publish Status Active
  • Publish Country GB
  • Imprint ISTE Press Ltd - Elsevier Inc
  • Format Hardcover
  • Pages 268
  • Language English