Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends (Chemical Analysis, Vol 86)

by A. Benninghoven, etc., F.G. Rudenauer, and H W Werner

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  • ISBN10 0471010561
  • ISBN13 9780471010562
  • Publish Date 4 February 1987
  • Publish Status Out of Stock
  • Out of Print 18 January 2011
  • Publish Country US
  • Imprint John Wiley & Sons Inc
  • Format Hardcover
  • Pages 1264
  • Language English