Includes the binomial tests of comparison and information on Accept-Reject Tests, the Sequential Probability Ratio Test, Bayesian MTBF and Reliability Demonstration Tests, as well as other important accelerated tests such as Arrhenius, Eyriing, Bazovsky, and Inverse Power Law.
- ISBN13 9781932078039
- Publish Date 1 January 2002
- Publish Status Transferred
- Publish Country US
- Imprint DEStech Publications, Inc
- Format Hardcover
- Pages 877
- Language English