This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
- ISBN13 9781441962164
- Publish Date 21 October 2010
- Publish Status Active
- Publish Country US
- Imprint Springer-Verlag New York Inc.
- Format Hardcover
- Pages 195
- Language English