In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

Gerhard Dehm (Editor), James M. Howe (Editor), and Josef Zweck (Editor)

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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
  • ISBN10 3527319735
  • ISBN13 9783527319732
  • Publish Date 26 April 2012 (first published 1 January 2012)
  • Publish Status Active
  • Publish Country DE
  • Publisher Wiley-VCH Verlag GmbH
  • Imprint Blackwell Verlag GmbH
  • Format Hardcover
  • Pages 402
  • Language English