Foundations of Measurement: Volume 2

by Patrick Suppes, etc., David M. Krantz, R. Duncan Luce, and Amos Tversky

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Foundations of Measurement offers the most coherently organized treatment of the topics and issues central to measurement. Much of the research involved has been scattered over several decades and a multitude of journals--available in many instances only to specialties. With the publication of Volumes two and three of this important work, Foundations of Measurement is the most comprehensive presentation in the area of measurement.
  • ISBN10 0124254020
  • ISBN13 9780124254022
  • Publish Date 23 January 1990 (first published 1 January 1990)
  • Publish Status Out of Print
  • Out of Print 20 November 2009
  • Publish Country US
  • Publisher Elsevier Science Publishing Co Inc
  • Imprint Academic Press Inc
  • Format Hardcover
  • Pages 493
  • Language English