Nanometer-scale Defect Detection Using Polarized Light

by Pierre-Richard Dahoo, Philippe Pougnet, and Abdelkhalak El Hami

0 ratings • 0 reviews • 0 shelved
Book cover for Nanometer-scale Defect Detection Using Polarized Light
Shelve It

Bookhype may earn a small commission from qualifying purchases. Full disclosure.

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

  • ISBN13 9781119329657
  • Publish Date 16 August 2016 (first published 12 August 2016)
  • Publish Status Active
  • Publish Country US
  • Publisher John Wiley & Sons Inc
  • Imprint Standards Information Network