This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.
- ISBN10 0818688327
- ISBN13 9780818688324
- Publish Date 31 December 1998
- Publish Status Active
- Publish Country US
- Imprint I.E.E.E.Press
- Format Paperback
- Pages 325
- Language English