This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
- ISBN10 6613350982
- ISBN13 9786613350985
- Publish Date 1 January 2012 (first published 27 September 2011)
- Publish Status Active
- Out of Print 7 March 2012
- Publish Country US
- Imprint Not Avail
- Format eBook
- Pages 231
- Language English