Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy (Springer Laboratory)

by Kailash C Khulbe, C Y Feng, and Takeshi Matsuura

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Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.

  • ISBN10 6611139850
  • ISBN13 9786611139858
  • Publish Date 1 January 2008 (first published 17 December 2007)
  • Publish Status Active
  • Out of Print 9 February 2012
  • Publish Country US
  • Imprint Springer
  • Format eBook
  • Pages 208
  • Language English