This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.
- ISBN10 0818684364
- ISBN13 9780818684364
- Publish Date May 1998
- Publish Status Out of Print
- Out of Print 13 December 2011
- Publish Country US
- Imprint IEEE Computer Society Press,U.S.
- Format Paperback
- Pages 500
- Language English