"Atomic Force Microscopy of Polymers: From High-Resolution Imaging to Probing Local Mechanical Properties" gives background information on how the atomic force microscope (AFM) was developed, how it is used for characterization techniques, and how it complements such techniques. The book details how to properly use this instrument, including preparing samples and developing theoretical models with the information from AFM-generated images.
- ISBN10 0470105240
- ISBN13 9780470105245
- Publish Date 23 December 2016
- Publish Status Cancelled
- Out of Print 12 November 2014
- Publish Country US
- Publisher John Wiley and Sons Ltd
- Imprint Wiley-Blackwell
- Format Hardcover
- Pages 320
- Language English