Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

by Rolf Erni

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Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical...Read more
  • ISBN13 9781783265282
  • Publish Date 18 May 2015
  • Publish Status Active
  • Publish Country GB
  • Imprint Imperial College Press