Ion Beam Analysis: Fundamentals and Applications

by Michael Nastasi, James W. Mayer, and Yongqiang Wang

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Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization.The book explains how ions interact with solids
  • ISBN13 9781439846391
  • Publish Date 27 August 2014 (first published 1 January 2014)
  • Publish Status Active
  • Publish Country US
  • Publisher Taylor & Francis Inc
  • Imprint CRC Press Inc
  • Format eBook
  • Pages 472
  • Language English