Kwang-Ting (Tim) Cheng | Bookhype

Dec 7, 2009

Cover of Efficient Test Methodologies for High-Speed Serial Links

Efficient Test Methodologies for High-Speed Serial Links (Lecture Notes in Electrical Engineering, #51)

Oct 31, 1998

Cover of Delay Fault Testing for VLSI Circuits

Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing, #14)

Jun 30, 1998

Cover of Formal Equivalence Checking and Design Debugging

Formal Equivalence Checking and Design Debugging (Frontiers in Electronic Testing, #12)

Jun 30, 1989

Cover of Unified Methods for VLSI Simulation and Test Generation

Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, #73)